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|TRAINING||Training is required to use this item.|
|CONTACT 1||Florian Ströbele|
|CONTACT 2||Sarah Paynter|
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X-ray fluorescence spectrometer used for non destructive qualitative and quantitative elemental analysis. All elements from Z=11 (Na) to Z=92 (U) can be detected. The device allows point as well as line and area scans, for the latter two flat samples are required. As XRF is a surface technique, minimal preparation may be required to expose the material of interest (e.g. if metals are tarnished or corroded)
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Last Updated: 3rd July, 2018