Scanning Electron Microscope

The Zeiss Ultra Plus is suitable for high-resolution imaging of biological and non-biological specimens. The microscope's charge compensation system allows non-conducting samples to be imaged without the need for coating. Key instrument features

Ultra high-resolution secondary and backscatter electron imaging, utilising in-lens detector technology. Energy selective backscatter detector (EsB) features an integrated filtering grid to enhance image quality. It is less sensitive to edge contrast and charging effects, which enables precise imaging and measurement of boundaries, particles and features. High-efficiency in-lens secondary electron detector enables high-contrast surface imaging. Scanning transmission electron microscope (STEM) detector offers bright field and orientated dark field modes, and a carousel transmission electron microscope (TEM) holder taking up to nine grids. Revolutionary charge compensation system for the imaging of non-conducting samples. Motorised six-axis super eucentric stage (-4° to 70° tilt), coupled with Zeiss SmartSEM image navigation, enables quick and simple sample navigation. Energy dispersive X-ray (EDX) micro-analysis.